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Research record

Publications

Peer-reviewed work, the patent record, and the identifiers that make all of it attributable to the right Varun Singh.

Peer-reviewed

  • IEEE ITCUnder review

    Lead-author paper on logic built-in self-test (LBIST), submitted to the IEEE International Test Conference, the field's principal venue for electronic test.

    Details published here on acceptance.

Patents

12 granted U.S. patents across 6 invention families, with 3 further applications pending, covering memory test and repair, distributed test power control, and clocking and reset architecture.

Full patent record →

Identifiers

Several researchers publish under this name. These identifiers disambiguate the record.