About
Varun Singh
Digital design and design-for-test leader working on how large chips are architected, built, connected and proven correct.
I have spent a decade on the parts of a chip most people never see: the interconnect that moves data between blocks, the infrastructure that lets a device test and repair itself, and the clocking and reset architecture that decides whether any of it survives contact with the real world.
I came to it through electronics and communication engineering at SRM Institute of Science and Technology, then a master’s in Electrical Engineering at theUniversity of Southern California, where digital design stopped being coursework and became the thing I wanted to do.
While still at USC I joined Luxima Technology, a startup building CMOS image sensors. It was the right kind of first job: small team, fast pace, and no distance between a design decision and its consequences. I worked on ADC and LVDS driver blocks and built an FPGA-based high-speed camera system on a Virtex-7 for automated wafer defect inspection.
Texas Instruments is where that turned into a career. I led SoC integration for silicon-proven 16nm devices and was microarchitect for clocking, debug and power on the Jacinto 7 TDA4 ADAS platform, working across the AM64x, AM62x and AM67 families. I owned the 16nm PBIST memory-test IP and architected an improved memory built-in self-repair that delivered measurable yield improvement and reduced FIT rate in production. That work became six invention families and twelve granted U.S. patents.
At Cadence I moved from building chips to building the IP other companies build chips with. I was design lead for JANUS, a packet-based, functional-safety-compliant non-coherent NoC now sold commercially, and worked on LBIST within the Modus DFT solution. I also pioneered a DFT-specific network architecture that distributes test across an SoC automatically, validated on advanced-node customer test chips down to 1.4nm.
I am now at Tenstorrent, leading the memory chiplet effort and contributing to the Grendel device programme, taking architectures from concept through to tape-out. The problems that interest me most are the ones where test, power and safety stop being separate concerns, which is increasingly where AI silicon lives.